Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/5736
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dc.contributor.authorMahanta, Ananya Jyoti-
dc.contributor.authorMukherjee, Shyamapada-
dc.date.accessioned2026-03-16T05:47:12Z-
dc.date.available2026-03-16T05:47:12Z-
dc.date.issued2026-03-
dc.identifier.citation6th International Conference on Expert Clouds and Applications (ICOECA), RV College of Engineering, Bengaluru, 9-11 March 2026en_US
dc.identifier.urihttp://hdl.handle.net/2080/5736-
dc.descriptionCopyright belongs to the proceeding publisher.en_US
dc.description.abstractSide-channel attacks are carried out by observing physical leakages such as power, timing, or electromagnetic emissions, and these leakages often reveal information about the internal operations of a cryptographic device. In this work, synthetic power-trace data with controlled fault patterns was generated so that the behavior of different machine learning models could be studied under a variety of fault conditions. Several types of artificial disturbances were injected into the traces using a structured simulation process, allowing both normal and faulty examples to be created at scale. The generated dataset was then used to evaluate multiple models, beginning with an autoencoder for feature compression followed by a Random Forest classifier on the encoded outputs. A deeper CNN model was later applied to learn features directly from raw traces, and this approach produced the best results. The CNN was also extended to a multi-class setting, and various optimizers were tested to check their influence on training stability. Overall, the models based on convolutional networks were found to perform the most reliably, indicating that deep feature extraction works better for high-dimensional side-channel data.en_US
dc.subjectSide Channel Attacken_US
dc.subjectEncryptionen_US
dc.subjectMachine Learningen_US
dc.subjectNormalizationen_US
dc.subjectPlain-texten_US
dc.titleCNN-Based Fault Classification in Side-Channel Power Traces with Robust Preprocessing and Regularizationen_US
dc.typeArticleen_US
Appears in Collections:Conference Papers

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