Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/5533
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dc.contributor.authorSahil-
dc.contributor.authorRathor, Krishna Kumar-
dc.contributor.authorRaj, Utsav-
dc.contributor.authorSethi, Biswajeet-
dc.contributor.authorThangkhiew, Phrangboklang Lyngton-
dc.contributor.authorYadav, Dev Narayan-
dc.date.accessioned2026-01-02T12:50:41Z-
dc.date.available2026-01-02T12:50:41Z-
dc.date.issued2025-12-
dc.identifier.citation5th International Conference on Advanced Network Technologies and Intelligent Computing (ANTIC), IIITM, Gwalior, 21-23 December 2025en_US
dc.identifier.urihttp://hdl.handle.net/2080/5533-
dc.descriptionCopyright belongs to the proceeding publisher.en_US
dc.description.abstractThe ability of resistive memory (ReRAM) to inherently perform vector-matrix multiplication (VMM), the core operation in the training and inference phase of neural networks, has drawn significant attention from researchers. Download-and-execute schemes are typically employed for ReRAM crossbars, where network weights are trained on a host system and subsequently programmed onto the crossbar. However, defective memristors and inter-device discrepancies frequently prevent cells from accurately storing the learned values, leading to considerable accuracy degradation during inference. This work proposes a fault-aware critical-subset mapping framework to address this issue. Our methodology initially trains the network with hardware variability awareness, considering non-ideal device impacts to enhance robustness. During deployment, only the top-k% most sensitive rows and columns of the weight matrices, determined via sensitivity analysis, are selected for program-verify iterations. In this subgroup, fault-aware placement prioritizes the allocation of substantial weights to appropriate devices, thereby reducing the impact of faults and variations. Experiments indicate that this method maintains over 92% accuracy with up to 10% defective cells for the MNIST dataset, showcasing a scalable and cost-effective mapping strategy.en_US
dc.subjectMemristoren_US
dc.subjectNeural Networken_US
dc.subjectCrossbaren_US
dc.subjectWeight-Mappingen_US
dc.titleFault Resilience in Memristor Crossbar: Sensitivity-Driven Mapping for Neural Acceleratorsen_US
dc.typeArticleen_US
Appears in Collections:Conference Papers

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