Broad Temperature Dependent Dielectric Study of Smsubstituted YCrO3 Perovskite

Abstract

This work studies crystal structure and dielectric relaxation behaviour in Y1-xSmxCrO3 (0 ≤ x ≤ 0.3) compositions characterized through X-ray diffraction (XRD) technique and dielectric spectroscopy. XRD spectra reveal the phase purity of compounds, which are crystallized through distorted orthorhombic structures with the Pnma space group. With Sm contents, lattice cell volume increases due to cationic size mismatch, distorting the crystal structure. The temperature-dependent dielectric study is carried out at a broad temperature range of 80 K-525 K at different frequencies. Sm content shows that both the dielectric constant and tan loss increase, which may be attributed to increasing charge carriers at the interfaces, and reveals that these compounds show relaxor-type behaviour