Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/4931
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dc.contributor.authorDash, Ipsita-
dc.contributor.authorKar, Sougata Kumar-
dc.contributor.authorSarkar, Santanu-
dc.date.accessioned2025-01-11T10:27:22Z-
dc.date.available2025-01-11T10:27:22Z-
dc.date.issued2024-12-
dc.identifier.citation21st IEEE INDICON 2024, IIT Kharagpur, India, 19-21 December 2024en_US
dc.identifier.urihttp://hdl.handle.net/2080/4931-
dc.descriptionCopyright of this document belongs to the proceedings publisher.en_US
dc.description.abstractThis paper describes the noise analysis in switched capacitor based differential capacitive interfacing circuits for MEMS accelerometers. The interfacing circuit consists of a switched capacitor based charge amplifier, an offset nullifier, and a sample and hold circuit. The transistors and the switches in these circuits contribute the thermal and flicker noise. The theoretical analysis is carried out and compared with the simulation results. First, the noise has been calculated in each phase and then the noise simulation is performed. Finally, the periodic operating point is determined using periodic steady-state analysis and after that the periodic noise(Pnoise) simulation is compared with the previous simulation results simulated in each phase. All the simulations are carried out at the transistor level using Cadence Virtuoso.en_US
dc.subjectCapacitive sensor systemen_US
dc.subjectInterfacing circuiten_US
dc.subjectsignal conditioningen_US
dc.subjectCalibration voltageen_US
dc.titleNoise Analysis in Switched Capacitor-based Differential Capacitive Interfacing Circuitsen_US
dc.typeArticleen_US
Appears in Collections:Conference Papers

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