Dielectric Properties of Epoxy/CCTO 0-3 Composites for Embedded Capacitor Applications

Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/3196

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DC Field	Value	Language
dc.contributor.author	Samanta, B	-
dc.contributor.author	Kumar, P	-
dc.date.accessioned	2019-01-11T13:12:17Z	-
dc.date.available	2019-01-11T13:12:17Z	-
dc.date.issued	2018-12	-
dc.identifier.citation	XX National Seminar on Ferroelectrics and Dielectrics (NSFD-2018), Bilaspur, India, 14-16 December 2018	en_US
dc.identifier.uri	http://hdl.handle.net/2080/3196	-
dc.description	Copyright of this document belongs to proceedings publisher.	en_US
dc.description.abstract	Dielectric properties of (1-x) Epoxy – x CCTO 0-3 composites were studied as a function of frequency and temperature with in the low filler concentration region (up to 20 vol%). For all the composite samples, dielectric constant was found to be weakly frequency dependent. Room temperature (RT) dielectric constant of epoxy matrix at 1 kHz frequency was found to be ~ 4.7. Maximum RT dielectric constant ~10 (at 1 kHz) was obtained in 20 vol% CCTO incorporated composites samples with significant low dielectric loss (tanδmax ~ 0.04 at ~200 kHz). Skipetrov and Yamada Models were used to correlate experimental and theoretical dielectric values of the composite samples	en_US
dc.subject	Dielectric Properties	en_US
dc.subject	Epoxy/CCTO	en_US
dc.subject	Embedded Capacitor	en_US
dc.title	Dielectric Properties of Epoxy/CCTO 0-3 Composites for Embedded Capacitor Applications	en_US
dc.type	Presentation	en_US
Appears in Collections:	Conference Papers

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2018_NSFD_BSamanta_DielectricProperties.pdf	Poster presentation	2.24 MB	Adobe PDF	View/Open