Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/3196
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dc.contributor.authorSamanta, B-
dc.contributor.authorKumar, P-
dc.date.accessioned2019-01-11T13:12:17Z-
dc.date.available2019-01-11T13:12:17Z-
dc.date.issued2018-12-
dc.identifier.citationXX National Seminar on Ferroelectrics and Dielectrics (NSFD-2018), Bilaspur, India, 14-16 December 2018en_US
dc.identifier.urihttp://hdl.handle.net/2080/3196-
dc.descriptionCopyright of this document belongs to proceedings publisher.en_US
dc.description.abstractDielectric properties of (1-x) Epoxy – x CCTO 0-3 composites were studied as a function of frequency and temperature with in the low filler concentration region (up to 20 vol%). For all the composite samples, dielectric constant was found to be weakly frequency dependent. Room temperature (RT) dielectric constant of epoxy matrix at 1 kHz frequency was found to be ~ 4.7. Maximum RT dielectric constant ~10 (at 1 kHz) was obtained in 20 vol% CCTO incorporated composites samples with significant low dielectric loss (tanδmax ~ 0.04 at ~200 kHz). Skipetrov and Yamada Models were used to correlate experimental and theoretical dielectric values of the composite samplesen_US
dc.subjectDielectric Propertiesen_US
dc.subjectEpoxy/CCTOen_US
dc.subjectEmbedded Capacitoren_US
dc.titleDielectric Properties of Epoxy/CCTO 0-3 Composites for Embedded Capacitor Applicationsen_US
dc.typePresentationen_US
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