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|Title:||On-Chip RO-Sensor for Recycled IC Detection|
|Authors:||Sahoo, Sauvagya Ranjan|
Swain, A. K
Mahapatra, Kamala Kanta
|Keywords:||Ring Oscillator (RO)|
Process variation (PV).
|Citation:||3rd IEEE International Symposium on Nanoelectronic and Information Systems, Bhopal, India, 18 – 20 December, 2017|
|Abstract:||The presence of recycled IC in the supply chain impacts the reliability of electronics systems used in critical applications. This paper presents a ring oscillator (RO)-based sensor to detect the recycled ICs. Although, ICs are used for a short duration, the proposed sensor is able to detect it. In this paper the modified RO shows more sensitive to negative bias temperature stability (NBTI) aging mechanism. Simulations are carried out using 90 nm CMOS technology to validate efficiency of proposed sensor for detection of recycled IC. Further, the RO with more number of cascaded inverters can detect the ICs used for a few days.|
|Description:||Copyright of this document belongs to proceedings publisher.|
|Appears in Collections:||Conference Papers|
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|2017_IEEE-iNIS_SRSahoo_On-Chip.pdf||Conference Paper||287.21 kB||Adobe PDF||View/Open|
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