Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/2337
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dc.contributor.authorSahoo, S R-
dc.contributor.authorKumar, S-
dc.contributor.authorMahapatra, K K-
dc.date.accessioned2015-07-07T11:47:04Z-
dc.date.available2015-07-07T11:47:04Z-
dc.date.issued2015-06-
dc.identifier.citation19th International Symposium on VLSI Design and Test (VDAT-2015) ,Institute of Technology, Nirma University, Ahmedabad, 26-29 June 2015.en_US
dc.identifier.urihttp://hdl.handle.net/2080/2337-
dc.descriptionCopyright belong to proceeding publisheren_US
dc.description.abstractPhysical Unclonable Functions (PUFs) are promising security primitives in recent times. A PUF is a die-specific random function or silicon biometric that is unique for every instance of the die. PUFs derive their randomness from the uncontrolled random variations in the IC manufacturing process which is used to generate cryptographic keys. Researchers have proposed different kinds of PUF in last decade, with varying properties. Quality of PUF is decided by its properties like: uniqueness, reliability, uniformity etc. In this paper we have designed a novel CMOS based RO PUF with improved quality metrics at the cost of vadditional hardware. The novel PUF is a modified Ring Oscillatorv PUF (RO-PUF), in which CMOS inverters of RO-PUF are replaced with Feedthrough logic (FTL) inverters. The FTL inverters in RO-PUF improve the security metrics because of its high leakage current. The use of pulse injection circuit (PIC) is responsible to increase challenge-response pairs (CRP’s). Then a comparison analysis has been carried out by simulating both the PUF in 90 nm technology. The simulation results shows that the proposed modified FTL PUF provides a uniqueness of 45.24% with a reliability of 91.14%.en_US
dc.language.isoenen_US
dc.subjectPhysical Unclonable Function (PUF)en_US
dc.subjectChallengeResponse pair (CRP)en_US
dc.subjectFeedthrough logic (FTL)en_US
dc.subjectRing Oscillator (RO)en_US
dc.subjectprocess variation (PV)en_US
dc.titleA Novel ROPUF for Hardware Securityen_US
dc.typeArticleen_US
Appears in Collections:Conference Papers

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