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Title: Dots and Incipient based Fingerprint Matching Scheme using FMM and Delaunay Triangulation
Authors: Swain, S
Majhi, B
Dash, R
Sa, Pankaj K
Keywords: Fingerprint
Extended feature
Level 3 feature
dots and incipient
Feature extraction
Delaunay triangulation
Issue Date: Dec-2014
Publisher: IEEE
Citation: 9th IEEE International Conference on Industrial and Information System (ICIIS), December 2014
Abstract: Automated Fingerprint Identification Systems (AFIS) currently rely only on Level 1 and Level 2 features. But these features are not much helpful for forensic experts as the experiment deals with partial to full print matching of latent fingerprint. Forensic experts takes the advantage of extended feature proposed by "Committee to Define an Extended Fingerprint Feature Set" (CDEFFS). This paper presents extraction technique of two extended features, dots and incipient ridges by tracing valleys. We have found starting points on the valley by analyzing the frequencies present in the fingerprint. Valley are traced from the starting point using first marching method ( FMM ). An intensity checking method is used for finding these feature points. Then matching are done by establishing spatial relation with minutiae using Delaunay triangulation. Extensive simulation is carried out in MATLAB environment to show the superiority of the proposed feature extraction technique over state of art. Accuracy of the proposed feature extraction scheme also has been shown using special database 30 and IIIT Delhi database.
Description: Copyright belongs to Proceeding publishers
Appears in Collections:Conference Papers

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