Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/5906
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dc.contributor.authorGupta, Sakshi-
dc.contributor.authorSaragadam, Uday Kumar-
dc.contributor.authorSengupta, Anwesha-
dc.date.accessioned2026-08-08T12:10:56Z-
dc.date.available2026-08-08T12:10:56Z-
dc.date.issued2026-07-
dc.identifier.citation1st IEEE International Conference on Instrumentation (INSTCon),NIT Rourkela, 24-25 July 2026en_US
dc.identifier.urihttp://hdl.handle.net/2080/5906-
dc.descriptionCopyright belongs to the proceeding publisher.en_US
dc.description.abstractThis paper investigates thermal facial emotion recognition using classical statistical methods and deep learning. Thermal imaging captures facial infrared radiation, offering a privacy-preserving and illumination-invariant alternative to visible-light imaging. We reproduce classical approaches from the KTFE dataset literature — Principal Component Analysis (PCA), the Eigenspace Minimum Classifier (EMC), and their combined PCA–EMC framework — and compare them against VGG-16. Experiments are conducted on 2140 images across six emotion classes from the KTFE database. VGG-16, pretrained on ImageNet and adapted with a Dense classification head and dropout regularization, is trained on 128 × 128 thermal facial images using the Adam optimizer with a frozen convo-lutional backbone. VGG-16 achieves classification accuracies up to 99.90%, substantially outperforming all classical baselines and confirming that deep convolutional networks can effectively learn discriminative thermal facial patterns. These results highlight the strong potential of thermal imaging for accurate, robust, and privacy-aware emotion recognition in human–computer interaction, mental health monitoring, and security applications.en_US
dc.subjectEmotion recognitionen_US
dc.subjectthermal imagesen_US
dc.subjectdeep learningen_US
dc.subjectfacial expressionen_US
dc.subjectKTFE databaseen_US
dc.subjectVGG-16en_US
dc.titleEmotion Recognition Using Facial Thermal Imaging: A Comparative Studyen_US
dc.typeArticleen_US
Appears in Collections:Conference Papers

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