Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/5015
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dc.contributor.authorAgrawal, Sneh-
dc.contributor.authorMukherjee, Shyamapada-
dc.date.accessioned2025-01-28T10:59:28Z-
dc.date.available2025-01-28T10:59:28Z-
dc.date.issued2024-12-
dc.identifier.citation12th International Conference on Intelligent Systems and Embedded Design (ISED), NIT Rourkela, India, 20-22nd December 2024en_US
dc.identifier.urihttp://hdl.handle.net/2080/5015-
dc.descriptionCopyright belongs to the proceeding publisher.en_US
dc.description.abstractWhile outsourcing fabrication and integrating thirdparty intellectual property has expedited IC development, it has also created substantial hardware attack surfaces, particularly Hardware Trojans (HTs). These harmful IC alterations, which are frequently hidden during design or production, present serious risks like data loss, illegal access, system malfunctions, and disastrous disruptions in vital industries like finance, healthcare, and defense. Due to their covert nature and dependence on uncommon circuit states, which are frequently outside the purview of conventional test sets, HT detection is difficult. Scalability, the lack of golden reference models in IP-based designs, and the adversary’s capacity to target only subsets of ICs are the main drawbacks of the pre-silicon and postsilicon verification techniques currently in use. Noise, ultra-small Trojan sensitivity, and variability in nanoscale processes impede advanced detection methods like side-channel analysis. This study investigates how a hardware Trojan affects a basic mathematical calculation running on a Basys3 FPGA board. When the Trojan is activated, the design—which computes the square of a 4- bit binary number—produces inaccurate results for particular inputs, highlighting the necessity of strong detection systems to guarantee IC security and dependabilityen_US
dc.subjectHardware Trojanen_US
dc.subjectFPGAen_US
dc.subjectHardware securityen_US
dc.titleTesting the Effect of Hardware Trojans: A Case Studyen_US
dc.typeArticleen_US
Appears in Collections:Conference Papers

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