Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/4315
Title: Leakage Power Reduction and Stability Analysis of 5nm node GAA CNTFET SRAMs
Authors: Soni, Devesh
Saha, Sumit
Keywords: 5nm node CNTFET SRAM
Low Power techniques
Delay
SNM
Leakage power
Issue Date: Dec-2023
Citation: International Journal for Computational Electronics for Wireless Communication (ICCWC), NIT Jalandhar, 22nd - 23rd December 2023
Abstract: In modern system-on-chips (SoCs), embedded static random access memory (SRAM) units are vital components that facilitate on-chip memory for fast data storage and access. However, traditional SRAM cells based on metal oxide semiconductor (MOS) designs consume relatively high power, making them less suitable for power constrained devices. Researchers are tackling the constraints of SRAM technology by investigating refined approaches rooted in carbon nano- tube field-effect transistors (CNTFETs) which includes fine-tuning of model Pa- rameters like nanotube diameter, flat band voltage, and CNT density to enhance SRAM cell performance and efficiency and to create more advanced and power- efficient memory solutions. The objective of this work is to design, evaluate and predict the performance of different SRAM cell by incorporating low-power strategies within 5nm node CNTFET 6T SRAM cell. These strategies encompass the Sleepy approach, Header approach, Footer approach, Zigzag approach, Leak- age feedback approach, Stack approach, Leakage feedback with stack approach, Sleepy keeper approach, Sleepy stack approach, and Sleepy stack with keeper approach. To evaluate their effectiveness, the research paper uses performance met- rics such as noise margin, delay, and leakage power.
Description: Copyright belongs to proceeding publisher
URI: http://hdl.handle.net/2080/4315
Appears in Collections:Conference Papers

Files in This Item:
File Description SizeFormat 
2023_ICCWC_DSoni_Leakage.pdf986.56 kBAdobe PDFView/Open    Request a copy


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.