Please use this identifier to cite or link to this item:
http://hdl.handle.net/2080/4066
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Samal, Anwesh Kumar | - |
dc.contributor.author | Kumar, Sandeep | - |
dc.contributor.author | Mukherjee, Atin | - |
dc.date.accessioned | 2023-09-29T05:49:52Z | - |
dc.date.available | 2023-09-29T05:49:52Z | - |
dc.date.issued | 2023-09 | - |
dc.identifier.citation | 7th IEEE International Test Conference in Asia (ITC-Asia) 2023, Matsue, Shimane, Japan, September 12-14, 2023 | en_US |
dc.identifier.uri | http://hdl.handle.net/2080/4066 | - |
dc.description | Copyright belongs to proceeding publisher | en_US |
dc.description.abstract | This paper proposes a soft error-resilient latch (SERL), which is capable of self-recovering of all possible single event upsets (SEU). The latch mainly uses two 1-output Celements and a 2-output C-element to create interlocked feedback loops. Simulation results from Mentor Graphics TSPICE show that proposed SERL is complete resilient to SEU from all of its internal nodes and the output node. Compared to the existing SEU resilient latches, the proposed latch shows the least power dissipation and area overhead, and the lowest cost in terms of power delay area product (PDAP). The proposed latch saves on average approximately 24.29% power, 10.24% area, improves 12% delay and 40% PDAP in comparision to other existing resilient latches. | en_US |
dc.subject | Single node upset | en_US |
dc.subject | radiation hardened latch | en_US |
dc.subject | robustness | en_US |
dc.subject | robustness | en_US |
dc.subject | single event upset | en_US |
dc.title | Design of Single Node Upset Resilient Latch for Low Power, Low Cost and Highly Robust Applications | en_US |
dc.type | Article | en_US |
Appears in Collections: | Conference Papers |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
2023_IEEE-ITC-Asia_SKSamal_Design.pdf | 515.96 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.