Please use this identifier to cite or link to this item:
http://hdl.handle.net/2080/4027
Title: | Structural and Optical Study of Pure CuI Thin Film by Horizontal Thermal Evaporation Technique |
Authors: | Biswal, Sameer Ranjan Kar, Jyoti Prakash |
Keywords: | CuI Thin Film Horizontal Thermal Evaporation |
Issue Date: | May-2023 |
Citation: | 8th Edition of International Conference on “Nanotechnology for Better Living” (ICNBL), NIT Srinagar, 25-29 May 2023 |
Abstract: | As an intrinsic p-type semiconductor with a wide band gap of 3.1 eV, copper iodide (CuI) has gradually attracted the attention of researchers. γCuI thin films are grown on silicon substrates using a horizontal thermal evaporation system, and the effect of gas flow on CuI thin film properties is thoroughly discussed. The X-ray diffraction (XRD) study confirms its polycrystalline nature and the γphase of CuI. A photoluminescence (PL) measurement system was used to know the optical behavior. The electrical study is done by Hall measurement, and its lowest resistivity is 3 × 10-1 Ω cm with a hole concentration of 3.2 × 1019 cm-3 and mobility of 27 cm2 V-1 s -1 . These results indicate that the high-purity CuI thin film by thermal evaporation can be used in different optoelectronic applications |
Description: | Copyright belongs to proceeding publisher |
URI: | http://hdl.handle.net/2080/4027 |
Appears in Collections: | Conference Papers |
Files in This Item:
File | Description | Size | Format | |
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2023_ICNBL_SRBiswal_Structural.pdf | Poster | 1.21 MB | Adobe PDF | View/Open |
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