Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/4027
Title: Structural and Optical Study of Pure CuI Thin Film by Horizontal Thermal Evaporation Technique
Authors: Biswal, Sameer Ranjan
Kar, Jyoti Prakash
Keywords: CuI Thin Film
Horizontal Thermal Evaporation
Issue Date: May-2023
Citation: 8th Edition of International Conference on “Nanotechnology for Better Living” (ICNBL), NIT Srinagar, 25-29 May 2023
Abstract: As an intrinsic p-type semiconductor with a wide band gap of 3.1 eV, copper iodide (CuI) has gradually attracted the attention of researchers. γCuI thin films are grown on silicon substrates using a horizontal thermal evaporation system, and the effect of gas flow on CuI thin film properties is thoroughly discussed. The X-ray diffraction (XRD) study confirms its polycrystalline nature and the γphase of CuI. A photoluminescence (PL) measurement system was used to know the optical behavior. The electrical study is done by Hall measurement, and its lowest resistivity is 3 × 10-1 Ω cm with a hole concentration of 3.2 × 1019 cm-3 and mobility of 27 cm2 V-1 s -1 . These results indicate that the high-purity CuI thin film by thermal evaporation can be used in different optoelectronic applications
Description: Copyright belongs to proceeding publisher
URI: http://hdl.handle.net/2080/4027
Appears in Collections:Conference Papers

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