On-Chip RO-Sensor for Recycled IC Detection

Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/2842

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DC Field	Value	Language
dc.contributor.author	Sahoo, Sauvagya Ranjan	-
dc.contributor.author	Sudeendra, K	-
dc.contributor.author	Mahapatra, A	-
dc.contributor.author	Swain, A. K	-
dc.contributor.author	Mahapatra, Kamala Kanta	-
dc.date.accessioned	2018-01-02T04:58:54Z	-
dc.date.available	2018-01-02T04:58:54Z	-
dc.date.issued	2017-12	-
dc.identifier.citation	3rd IEEE International Symposium on Nanoelectronic and Information Systems, Bhopal, India, 18 – 20 December, 2017	en_US
dc.identifier.uri	http://hdl.handle.net/2080/2842	-
dc.description	Copyright of this document belongs to proceedings publisher.	en_US
dc.description.abstract	The presence of recycled IC in the supply chain impacts the reliability of electronics systems used in critical applications. This paper presents a ring oscillator (RO)-based sensor to detect the recycled ICs. Although, ICs are used for a short duration, the proposed sensor is able to detect it. In this paper the modified RO shows more sensitive to negative bias temperature stability (NBTI) aging mechanism. Simulations are carried out using 90 nm CMOS technology to validate efficiency of proposed sensor for detection of recycled IC. Further, the RO with more number of cascaded inverters can detect the ICs used for a few days.	en_US
dc.subject	Ring Oscillator (RO)	en_US
dc.subject	Recycling	en_US
dc.subject	Process variation (PV).	en_US
dc.subject	Aging	en_US
dc.title	On-Chip RO-Sensor for Recycled IC Detection	en_US
dc.type	Article	en_US
Appears in Collections:	Conference Papers

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