Please use this identifier to cite or link to this item: http://hdl.handle.net/2080/2592
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dc.contributor.authorSudeendra Kumar, K-
dc.contributor.authorSatheesh, N-
dc.contributor.authorMahapatra, A-
dc.contributor.authorSahoo, S-
dc.contributor.authorMahapatra, K K-
dc.date.accessioned2016-12-28T11:51:55Z-
dc.date.available2016-12-28T11:51:55Z-
dc.date.issued2016-12-
dc.identifier.citationIEEE International Symposium on Nanoelectronic and Information Systems (iNIS), ABV-IITM,Gwalior, India 19-21 December 2016en_US
dc.identifier.urihttp://hdl.handle.net/2080/2592-
dc.descriptionCopyright belongs to the proceeding publisheren_US
dc.description.abstractLarge number of on-chip instruments support postsilicon validation, volume test, debug, diagnosis and in-field monitoring of an integrated circuit. The IEEE 1687-2014 (Internal JTAG or IJTAG) standard is an effective method for accessing the on-chip instruments. Streamlined access to on-chip instruments through IJTAG is prone to abuse and lead to security issues. An adversary can leak confidential data or get an access to design details of IC through IJTAG network. Recently, locking and unlocking mechanism for IJTAG is proposed to secure the access to on-chip instruments. This paper presents a novel Physical Unclonable Function (PUF) based secure access method for on-chip instruments which enhances the security of IJTAG network and reduces the routing congestion in an integrated circuit.en_US
dc.publisherIEEEen_US
dc.subjectPhysical Unclonable Functionen_US
dc.subjectHardware Securityen_US
dc.titleSecuring IEEE 1687 Standard On-chip Instrumentation Access using PUFen_US
dc.typeArticleen_US
Appears in Collections:Conference Papers

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