Browsing by Subject IEEE 1500
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| Jul-2018 | PUF-based Secure Test Wrapper for SoC Testing | Sudeendra Kumar, K; Seth, Saurabh; Sahoo, Sauvagya; Mahapatra, Abhishek; Swain, Ayas Kanta; Mahapatra, K K |