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Issue Date
Title
Author(s)
Mar-2024
Exploring Deep Learning-based Unsupervised Image Anomaly Detection and Localization Methods for Industrial Quality Assurance
Dutta, Pritha
;
Nayak, Rashmiranjan
;
Pati, Umesh Chandra
Aug-2024
Attention-enabled Convolutional Autoencoder with Optimal Threshold to Detect Image Anomaly for Industrial Quality Assurance
Nayak, Rashmiranjan
;
Dutta, Pritha
;
Pati, Umesh Chandra
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Author
2
Nayak, Rashmiranjan
2
Pati, Umesh Chandra
Subject
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Attention-enabled Convolutional A...
1
CFlow
1
DFKDE
1
DFM
1
Image Anomaly Detection
1
Image anomaly detection and local...
1
Indusrtial quality assurance
1
Industrial Defect Detection
1
Optimal Threshold
1
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Date issued
2
2024